JPS6249936B2 - - Google Patents

Info

Publication number
JPS6249936B2
JPS6249936B2 JP10445979A JP10445979A JPS6249936B2 JP S6249936 B2 JPS6249936 B2 JP S6249936B2 JP 10445979 A JP10445979 A JP 10445979A JP 10445979 A JP10445979 A JP 10445979A JP S6249936 B2 JPS6249936 B2 JP S6249936B2
Authority
JP
Japan
Prior art keywords
signal
flip
flop
sampling
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10445979A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5627659A (en
Inventor
Tadashi Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP10445979A priority Critical patent/JPS5627659A/ja
Publication of JPS5627659A publication Critical patent/JPS5627659A/ja
Publication of JPS6249936B2 publication Critical patent/JPS6249936B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
JP10445979A 1979-08-16 1979-08-16 Glicth detection system Granted JPS5627659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10445979A JPS5627659A (en) 1979-08-16 1979-08-16 Glicth detection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10445979A JPS5627659A (en) 1979-08-16 1979-08-16 Glicth detection system

Publications (2)

Publication Number Publication Date
JPS5627659A JPS5627659A (en) 1981-03-18
JPS6249936B2 true JPS6249936B2 (en]) 1987-10-22

Family

ID=14381176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10445979A Granted JPS5627659A (en) 1979-08-16 1979-08-16 Glicth detection system

Country Status (1)

Country Link
JP (1) JPS5627659A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105116318A (zh) * 2015-09-02 2015-12-02 电子科技大学 一种逻辑分析仪中实现毛刺检测的方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3860705D1 (de) * 1988-01-28 1990-10-31 Hewlett Packard Gmbh Erkennungsschaltung fuer binaersignalzustandswechsel.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105116318A (zh) * 2015-09-02 2015-12-02 电子科技大学 一种逻辑分析仪中实现毛刺检测的方法
CN105116318B (zh) * 2015-09-02 2018-02-02 电子科技大学 一种逻辑分析仪中实现毛刺检测的方法

Also Published As

Publication number Publication date
JPS5627659A (en) 1981-03-18

Similar Documents

Publication Publication Date Title
JPH0129093B2 (en])
JPH0361908B2 (en])
US3843893A (en) Logical synchronization of test instruments
JPS6249936B2 (en])
US4631697A (en) Signal controlled waveform recorder
US4689791A (en) Device for translating a test sequence to a burn-in sequence for a logic circuit and/or a digital circuit, a method for burn-in operation of a logic circuit and/or a digital circuit
US5815105A (en) Analog-to-digital converter with writable result register
KR19980071839A (ko) 오류 데이터 저장 시스템
US6378092B1 (en) Integrated circuit testing
JPH0133052B2 (en])
JP2849007B2 (ja) 半導体集積回路
JPS6331935B2 (en])
JPS6329226B2 (en])
USRE34843E (en) Signal controlled waveform recorder
JPH0119545B2 (en])
JPH0633617Y2 (ja) 開閉接点のチヤタリング防止回路
JPS6030879Y2 (ja) 前置波形記憶装置
JPS6111803Y2 (en])
SU1597875A1 (ru) Программируемый источник питани
JP3281898B2 (ja) メモリ搭載半導体装置及びメモリテスト方法
SU1108453A1 (ru) Устройство дл функционально-динамического контрол логических схем
JPS6142358B2 (en])
JP2512993B2 (ja) リセット回路
SU1168952A1 (ru) Устройство дл контрол дискретной аппаратуры с блочной структурой
JPH051162Y2 (en])